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HITACHI S-3700N
    描述
    Condition- Deinstalled & Vinyl Packed Working condition before de-installed
    配置
    Simple Packing List: ①Main Body(Colum Unit) ②Display Unit(Operation Table) ③Air Compressor(Hitachi) ④Rotary Pump(Ulvac/GLD136B) ⑤EDS(EDAX/OCTANE Plus) ⑥Navigation Camera ⑦ESED(Optional accssories) ●Simple performance: ①Resolution: SE 3.0nm at 30kV(High vacuum mode) 10nm at 3kV(High Vacuum mode) BSE 4.0nm at 30kV(Low vacuum mode) ②Magnification:×5~×300,000 ③Accelerating voltage:0.3~30kV ④Specimen stage:X 150mm・Y 110mm・Z 5-65mm・R 360℃・T -20℃-90℃ ⑤Maximum specimen size:300mm in diameter ⑥Software:Windows7 of SEM, EDS PC
    OEM 代工型號說明
    S-3700N is designed as a new series of Tungsten-type VP-SEM to accommodate sample diameters up to 300mm using a new large specimen chamber and a large specimen stage. Moreover, simultaneous accommodations of accessory attachments for EDX, WDX and EBSP (*1) analyses are possible at optimized analytical geometry. The specimen stage has a wide traverse range for observation of sample areas up to 203mm diameter and up to 110mm height with EDX and WDX analysis.
    文檔

    HITACHI

    S-3700N

    verified-listing-icon

    已驗證

    類別
    SEM / FIB

    上次驗證: 超過60天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    Deinstalled


    產品編號:

    78351


    晶圓尺寸:

    未知


    年份:

    2012


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    類似上架商品
    查看全部
    HITACHI S-3700N

    HITACHI

    S-3700N

    SEM / FIB
    年份: 2012條件: 二手
    上次驗證超過60天前

    HITACHI

    S-3700N

    verified-listing-icon
    已驗證
    類別
    SEM / FIB
    上次驗證: 超過60天前
    listing-photo-4c56878253784171b4b74c57bb54e834-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/55031/4c56878253784171b4b74c57bb54e834/ed4060d78e064e04865cd5e0a3e3c809_052321_mw.png
    listing-photo-4c56878253784171b4b74c57bb54e834-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/55031/4c56878253784171b4b74c57bb54e834/74e6b82185a24c9c8474b864889e243d_052331_mw.png
    listing-photo-4c56878253784171b4b74c57bb54e834-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/55031/4c56878253784171b4b74c57bb54e834/ca1e55a65b7343d5b51af1250cb8601c_052311_mw.png
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    Deinstalled


    產品編號:

    78351


    晶圓尺寸:

    未知


    年份:

    2012


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    Condition- Deinstalled & Vinyl Packed Working condition before de-installed
    配置
    Simple Packing List: ①Main Body(Colum Unit) ②Display Unit(Operation Table) ③Air Compressor(Hitachi) ④Rotary Pump(Ulvac/GLD136B) ⑤EDS(EDAX/OCTANE Plus) ⑥Navigation Camera ⑦ESED(Optional accssories) ●Simple performance: ①Resolution: SE 3.0nm at 30kV(High vacuum mode) 10nm at 3kV(High Vacuum mode) BSE 4.0nm at 30kV(Low vacuum mode) ②Magnification:×5~×300,000 ③Accelerating voltage:0.3~30kV ④Specimen stage:X 150mm・Y 110mm・Z 5-65mm・R 360℃・T -20℃-90℃ ⑤Maximum specimen size:300mm in diameter ⑥Software:Windows7 of SEM, EDS PC
    OEM 代工型號說明
    S-3700N is designed as a new series of Tungsten-type VP-SEM to accommodate sample diameters up to 300mm using a new large specimen chamber and a large specimen stage. Moreover, simultaneous accommodations of accessory attachments for EDX, WDX and EBSP (*1) analyses are possible at optimized analytical geometry. The specimen stage has a wide traverse range for observation of sample areas up to 203mm diameter and up to 110mm height with EDX and WDX analysis.
    文檔
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    查看全部
    HITACHI S-3700N

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    SEM / FIB年份: 2012條件: 二手上次驗證:超過60天前
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    SEM / FIB年份: 0條件: 二手上次驗證:超過60天前