描述
ANALYTICAL EQUIPMENT配置
FA SEMs/TEMs/Dual Beams 200kV dedicated STEM with thermal FE election source Resolution 0.204nm Phase contract image (TE image), Z-contrast image (ZC image), Secondary electron image (SE image)OEM 代工型號說明
200 kV dedicated STEM for semiconducting industry, materials science and biological science.文檔
無文檔
HITACHI
HD-2300
已驗證
類別
SEM / FIB
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
20309
晶圓尺寸:
未知
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
HITACHI
HD-2300
類別
SEM / FIB
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
20309
晶圓尺寸:
未知
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
ANALYTICAL EQUIPMENT配置
FA SEMs/TEMs/Dual Beams 200kV dedicated STEM with thermal FE election source Resolution 0.204nm Phase contract image (TE image), Z-contrast image (ZC image), Secondary electron image (SE image)OEM 代工型號說明
200 kV dedicated STEM for semiconducting industry, materials science and biological science.文檔
無文檔