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THERMOFISHER SCIENTIFIC / FEI / PHILLIPS XL50
    描述
    無描述
    配置
    Scanning Electron Microscope (SEM FEI XL50 Large sample chamber w/ load lock Capable to navigate full 8” wafer. Stage platen to hold full wafer Stage platen for multi stub analysis System is installed and operational Noran EDS detector
    OEM 代工型號說明
    Scanning Electron Microscope
    文檔

    無文檔

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    XL50

    verified-listing-icon

    已驗證

    類別
    SEM / FIB

    上次驗證: 超過60天前

    關鍵商品詳情
    條件:

    Used

    作業狀態:

    Installed / Running

    產品編號:

    106592

    晶圓尺寸:

    8"/200mm

    年份:

    未知

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
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    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS XL50

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    XL50

    SEM / FIB
    年份: 0條件: 二手
    上次驗證超過60天前

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    XL50

    verified-listing-icon
    已驗證
    類別
    SEM / FIB
    上次驗證: 超過60天前
    listing-photo-59b41486c9eb41aabe13c232cdf27b8b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/59b41486c9eb41aabe13c232cdf27b8b/38dae80b71814bf38a53fc90587c4001_236677b67b9a49f496b86efa74f8c8a61201a_mw.jpeg
    listing-photo-59b41486c9eb41aabe13c232cdf27b8b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/59b41486c9eb41aabe13c232cdf27b8b/182dd0818a3c4f1ebcd2984df58fadad_4039d73b2f624fc38421d284403382061201a_mw.jpeg
    listing-photo-59b41486c9eb41aabe13c232cdf27b8b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/59b41486c9eb41aabe13c232cdf27b8b/f19cd4d7032b42afa4f4ca49ca31ac5e_e6751da9a7a440adba2a12ad59206d69_mw.jpeg
    listing-photo-59b41486c9eb41aabe13c232cdf27b8b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/59b41486c9eb41aabe13c232cdf27b8b/50d72f683ea34c459c3d7ca97e79b32b_984fc513ced24c68b8b4b97e2c0ca1dc_mw.jpeg
    listing-photo-59b41486c9eb41aabe13c232cdf27b8b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/59b41486c9eb41aabe13c232cdf27b8b/ff5806e127714b8a96b87b5df596e3b1_59947b8bf1cf4383a1e7bb42846a4d65_mw.jpeg
    listing-photo-59b41486c9eb41aabe13c232cdf27b8b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/59b41486c9eb41aabe13c232cdf27b8b/7a4ea99a073e479fa132a4e522459d03_c8c06cebf72d4a519cb388abe2986a9b_mw.jpeg
    listing-photo-59b41486c9eb41aabe13c232cdf27b8b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/59b41486c9eb41aabe13c232cdf27b8b/e0b80c59da634d99822f2da87afdcc1f_457737e8432b4a829c675216985da2c4_mw.jpeg
    listing-photo-59b41486c9eb41aabe13c232cdf27b8b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/59b41486c9eb41aabe13c232cdf27b8b/8b82e9f60e984966b66013297f2ea9b2_c32f68d622e34971aa078c1f85f9f2521201a_mw.jpeg
    關鍵商品詳情
    條件:

    Used

    作業狀態:

    Installed / Running

    產品編號:

    106592

    晶圓尺寸:

    8"/200mm

    年份:

    未知

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    無描述
    配置
    Scanning Electron Microscope (SEM FEI XL50 Large sample chamber w/ load lock Capable to navigate full 8” wafer. Stage platen to hold full wafer Stage platen for multi stub analysis System is installed and operational Noran EDS detector
    OEM 代工型號說明
    Scanning Electron Microscope
    文檔

    無文檔

    類似上架商品
    查看全部
    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS XL50

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    XL50

    SEM / FIB年份: 0條件: 二手上次驗證:超過60天前