描述
The ThermoFisher Apreo HiVac SEM is a Schottky Field Emission Scanning Electron Microscope (FESEM) that combines high and low-voltage ultra-high resolution capabilities with an electrostatic lens design. The instrument features beam deceleration and unique in-lens detection offering unprecedented contrast and versatility to researchers working with a variety of materials and devices. Achievable resolution is 0.8nm at 15kV and 1.0nm at 1kV using the immersion lens.配置
- Large capacity 5-axis stage with Nav-Cam visual navigation, greatly increasing ease of use and sample throughput - Beam current range: 0.78pA - 100nA - Accelerating voltage up to 30kV, with landing energy as low as 20eV - Everhart-Thornley detector (with secondary and backscatter modes) - In-column detectors - Sub-nanometer imaging resolution at high kV; ~ 1nm resolution at 1kV - Directional backscatter (DBS) detectorOEM 代工型號說明
未提供文檔
無文檔
類別
SEM / FIB
上次驗證: 4 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
147933
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
THERMOFISHER SCIENTIFIC / FEI / PHILIPS
APREO
類別
SEM / FIB
上次驗證: 4 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
147933
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
The ThermoFisher Apreo HiVac SEM is a Schottky Field Emission Scanning Electron Microscope (FESEM) that combines high and low-voltage ultra-high resolution capabilities with an electrostatic lens design. The instrument features beam deceleration and unique in-lens detection offering unprecedented contrast and versatility to researchers working with a variety of materials and devices. Achievable resolution is 0.8nm at 15kV and 1.0nm at 1kV using the immersion lens.配置
- Large capacity 5-axis stage with Nav-Cam visual navigation, greatly increasing ease of use and sample throughput - Beam current range: 0.78pA - 100nA - Accelerating voltage up to 30kV, with landing energy as low as 20eV - Everhart-Thornley detector (with secondary and backscatter modes) - In-column detectors - Sub-nanometer imaging resolution at high kV; ~ 1nm resolution at 1kV - Directional backscatter (DBS) detectorOEM 代工型號說明
未提供文檔
無文檔