描述
THERMOFISHER SCIENTIFIC / FEI / PHILIPS Nova 600i NANOLAB Dual Beam FIB/SEM配置
FEI Nova 600i Dual Beam FIB-SEM System: - FEI Nova Dual Beam (FIB + SEM) - Gallium liquid metal ion source (FIB) - Field emission electron source (SEM) Software / automation: - AutoTEM — automated TEM lamella preparation - AutoFIB — automated FIB milling and serial sectioning - AutoScript — scripting environment for custom automation Gas Injection System: - 3-port GIS: Platinum (Pt) / iDep2 / Gold (Au) - Note: originally configured with IEE (XeF₂ etch), modified to Au Micromanipulation: - Omniprobe in-situ micromanipulator Analytical detectors: - EDAX EBSD system — included (not currently installed, available with tool) - EDS — not included (retained by seller)OEM 代工型號說明
Nova 600 Nanolab DualBeam-SEM/FIB for Nanoscale Prototyping, Machining, Characterization, and Analysis of Structures below 100 nm.文檔
類別
SEM / FIB
上次驗證: 7 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
150788
晶圓尺寸:
未知
年份:
2008
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
類似上架商品
查看全部
THERMOFISHER SCIENTIFIC / FEI / PHILIPS
NOVA 600 NANOLAB
類別
SEM / FIB
上次驗證: 7 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
150788
晶圓尺寸:
未知
年份:
2008
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available