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THERMOFISHER SCIENTIFIC / FEI / PHILIPS NOVA NANOSEM 600
  • THERMOFISHER SCIENTIFIC / FEI / PHILIPS NOVA NANOSEM 600
  • THERMOFISHER SCIENTIFIC / FEI / PHILIPS NOVA NANOSEM 600
  • THERMOFISHER SCIENTIFIC / FEI / PHILIPS NOVA NANOSEM 600
  • THERMOFISHER SCIENTIFIC / FEI / PHILIPS NOVA NANOSEM 600
  • THERMOFISHER SCIENTIFIC / FEI / PHILIPS NOVA NANOSEM 600
  • THERMOFISHER SCIENTIFIC / FEI / PHILIPS NOVA NANOSEM 600
  • THERMOFISHER SCIENTIFIC / FEI / PHILIPS NOVA NANOSEM 600
描述
Details Attached
配置
無配置
OEM 代工型號說明
The Nova NanoSEM 600 is a type of high-resolution scanning electron microscope (SEM) that comes equipped with SED, BSED, and STEM detectors. It is a Dual Beam SEM/FIB system that combines the capabilities of ultra-high resolution field emission Scanning Electron Microscopy (SEM) with the precision of Focused Ion Beam (FIB) etching and deposition, making it ideal for nanoscale prototyping, machining, characterization, and analysis. When operating in STEM mode, this microscope can achieve a resolution as low as 1 nanometer. Additionally, the Nova NanoSEM 600 is capable of operating under low vacuum conditions and offers a range of analytical options including EBSD and EDS.
文檔
類別
SEM / FIB

上次驗證: 超過30天前

關鍵商品詳情

條件:

Refurbished


作業狀態:

未知


產品編號:

128730


晶圓尺寸:

未知


年份:

未知


Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

THERMOFISHER SCIENTIFIC / FEI / PHILIPS

NOVA NANOSEM 600

verified-listing-icon
已驗證
類別
SEM / FIB
上次驗證: 超過30天前
listing-photo-73944a2f65f648a0833cb10776e1b658-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/74875/73944a2f65f648a0833cb10776e1b658/eed3e929aca34e8dbcddd3cb1c8e9630_7b674024d7f643029bdf175edffdf8c71105c_mw.jpeg
listing-photo-73944a2f65f648a0833cb10776e1b658-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/74875/73944a2f65f648a0833cb10776e1b658/5477ff4a832544ba91ff0f96dcb14598_ab0f73d60b7e4f5e9e5630e57b73e2871105c_mw.jpeg
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listing-photo-73944a2f65f648a0833cb10776e1b658-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/74875/73944a2f65f648a0833cb10776e1b658/593ca466ad514c0ca4d5e86926ca265d_c8eceb79d41e44baa781b2d9a53c1c921105c_mw.jpeg
listing-photo-73944a2f65f648a0833cb10776e1b658-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/74875/73944a2f65f648a0833cb10776e1b658/ad9fce421550491aa6cb4476582c59de_95456f7e5826492488f26b268fa03d821105c_mw.jpeg
關鍵商品詳情

條件:

Refurbished


作業狀態:

未知


產品編號:

128730


晶圓尺寸:

未知


年份:

未知


Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
Details Attached
配置
無配置
OEM 代工型號說明
The Nova NanoSEM 600 is a type of high-resolution scanning electron microscope (SEM) that comes equipped with SED, BSED, and STEM detectors. It is a Dual Beam SEM/FIB system that combines the capabilities of ultra-high resolution field emission Scanning Electron Microscopy (SEM) with the precision of Focused Ion Beam (FIB) etching and deposition, making it ideal for nanoscale prototyping, machining, characterization, and analysis. When operating in STEM mode, this microscope can achieve a resolution as low as 1 nanometer. Additionally, the Nova NanoSEM 600 is capable of operating under low vacuum conditions and offers a range of analytical options including EBSD and EDS.
文檔