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WYKO / VEECO NT2000
  • WYKO / VEECO NT2000
描述
無描述
配置
Vertical resolution of a few angstrom over a wide area (5 X 5 mm2)
OEM 代工型號說明
The WYKO NT2000 is an advanced optical profiler that provides ultra-precise 3-D analyses of surfaces for process control. It can measure heights from 0.1 nm to several millimeters, with vertical resolution as low as 0.1 nm. The fully automated system provides submicron precision and fast throughput, while non-automated versions are available for R&D applications. The instrument can accurately measure a wide variety of materials and is ideally suited for R&D investigation, quality inspection, failure analysis, and in-line production measurements.
文檔

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類別
Profiler

上次驗證: 超過60天前

關鍵商品詳情

條件:

Used


作業狀態:

未知


產品編號:

98586


晶圓尺寸:

未知


年份:

未知


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

WYKO / VEECO

NT2000

verified-listing-icon
已驗證
類別
Profiler
上次驗證: 超過60天前
listing-photo-c749e5435c8741b6801db974409f97e9-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/47072/c749e5435c8741b6801db974409f97e9/ad1e779cde9248418d6bed57ee839567_1ce21dd7fb6d4fae8e16cf519f449b3c1201a_mw.jpeg
關鍵商品詳情

條件:

Used


作業狀態:

未知


產品編號:

98586


晶圓尺寸:

未知


年份:

未知


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述
配置
Vertical resolution of a few angstrom over a wide area (5 X 5 mm2)
OEM 代工型號說明
The WYKO NT2000 is an advanced optical profiler that provides ultra-precise 3-D analyses of surfaces for process control. It can measure heights from 0.1 nm to several millimeters, with vertical resolution as low as 0.1 nm. The fully automated system provides submicron precision and fast throughput, while non-automated versions are available for R&D applications. The instrument can accurately measure a wide variety of materials and is ideally suited for R&D investigation, quality inspection, failure analysis, and in-line production measurements.
文檔

無文檔