概述

The WYKO NT2000 is an advanced optical profiler that provides ultra-precise 3-D analyses of surfaces for process control. It can measure heights from 0.1 nm to several millimeters, with vertical resolution as low as 0.1 nm. The fully automated system provides submicron precision and fast throughput, while non-automated versions are available for R&D applications. The instrument can accurately measure a wide variety of materials and is ideally suited for R&D investigation, quality inspection, failure analysis, and in-line production measurements.