描述
KLA-Tencor P-10 Surface Profiler Manufacturer: KLA-Tencor Model: P-10 Equipment Type: Surface Profiler Measurement Method: Contact Stylus Maximum Wafer Size: 8 inch (200 mm) Measurement Capabilities: Step Height, Surface Roughness, Waviness Vertical Measurement Range: Up to approximately 300 µm (configuration dependent) Vertical Resolution: 0.5 / 2 / 10 Å (depending on configuration) Scan Length: 60 mm standard; up to 150 mm on some configurations Scan Speed: 1 µm/s to 25 mm/s Stylus Tip: Diamond, 2 µm radius (configuration dependent) Stage: Motorized XY Stage The KLA-Tencor P-10 is a contact stylus surface profiler designed for measuring step height, surface roughness, and waviness on semiconductor wafers and other materials. Specifications depend on the installed measurement head and configuration.配置
無配置OEM 代工型號說明
Tencor P-10 is an equipment used for research and development engineering that analyzes various substrates, including glass, ceramics, wafers, disks, and precision-machined surfaces. With an optional MicroHead II low-force measurement head, it can accurately measure soft surfaces like indium, gold, and photoresist.文檔
無文檔
類似上架商品
查看全部
KLA
P-10
類別
Profiler
上次驗證: 8 天前
關鍵商品詳情
條件:
Used
作業狀態:
Deinstalled
產品編號:
153632
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
KLA-Tencor P-10 Surface Profiler Manufacturer: KLA-Tencor Model: P-10 Equipment Type: Surface Profiler Measurement Method: Contact Stylus Maximum Wafer Size: 8 inch (200 mm) Measurement Capabilities: Step Height, Surface Roughness, Waviness Vertical Measurement Range: Up to approximately 300 µm (configuration dependent) Vertical Resolution: 0.5 / 2 / 10 Å (depending on configuration) Scan Length: 60 mm standard; up to 150 mm on some configurations Scan Speed: 1 µm/s to 25 mm/s Stylus Tip: Diamond, 2 µm radius (configuration dependent) Stage: Motorized XY Stage The KLA-Tencor P-10 is a contact stylus surface profiler designed for measuring step height, surface roughness, and waviness on semiconductor wafers and other materials. Specifications depend on the installed measurement head and configuration.配置
無配置OEM 代工型號說明
Tencor P-10 is an equipment used for research and development engineering that analyzes various substrates, including glass, ceramics, wafers, disks, and precision-machined surfaces. With an optional MicroHead II low-force measurement head, it can accurately measure soft surfaces like indium, gold, and photoresist.文檔
無文檔