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TEL / TOKYO ELECTRON P-8XL
    描述
    無描述
    配置
    Prober Process: Back-end
    OEM 代工型號說明
    The P-8XL Prober is a market innovation in the wafer probing industry by TEL. It offers superior accuracy, reliability, efficiency, and integration for the test cell through its features such as on-axis alignment, optical wafer profiling, and direct test head docking. The P-8XL is equipped with a fully interactive LCD Touch Panel Screen and TEL’s advanced On-Axis Alignment System, delivering guaranteed pin-to-pad accuracy. It also offers a range of features to overcome probe floor barriers, including Direct Coupling Test Interfaces, Automatic Probe Card Changers, Clean Air Management Systems, Temperature Controlled Chucks, and many others. With its advanced capabilities, the P-8XL is ready to meet the demands of future device complexity and measurement precision.
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    TEL / TOKYO ELECTRON

    P-8XL

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    已驗證

    類別

    Probers
    上次驗證: 超過60天前
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    57290


    晶圓尺寸:

    8"/200mm


    年份:

    未知

    Have Additional Questions?
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    TEL / TOKYO ELECTRON P-8XL
    TEL / TOKYO ELECTRONP-8XLProbers
    年份: 0條件: 二手
    上次驗證15 天前

    TEL / TOKYO ELECTRON

    P-8XL

    verified-listing-icon

    已驗證

    類別

    Probers
    上次驗證: 超過60天前
    listing-photo-16ea692dc4c1403a91fe5193d0b3ed9b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/41089/16ea692dc4c1403a91fe5193d0b3ed9b/d3b345eafbff4fc182c6aa0433693c17_84cff04f99664091aae94a27a2607d5d1201a_mw.jpeg
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    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    57290


    晶圓尺寸:

    8"/200mm


    年份:

    未知


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    無描述
    配置
    Prober Process: Back-end
    OEM 代工型號說明
    The P-8XL Prober is a market innovation in the wafer probing industry by TEL. It offers superior accuracy, reliability, efficiency, and integration for the test cell through its features such as on-axis alignment, optical wafer profiling, and direct test head docking. The P-8XL is equipped with a fully interactive LCD Touch Panel Screen and TEL’s advanced On-Axis Alignment System, delivering guaranteed pin-to-pad accuracy. It also offers a range of features to overcome probe floor barriers, including Direct Coupling Test Interfaces, Automatic Probe Card Changers, Clean Air Management Systems, Temperature Controlled Chucks, and many others. With its advanced capabilities, the P-8XL is ready to meet the demands of future device complexity and measurement precision.
    文檔

    無文檔

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