描述
Suss MicroTec PA300 ProbeShield Probing Station, 115V, 60Hz, w/ Seiwa Optical Correct probing microscope, Guppy F-046C IRF camera, FWF10x eyepieces, Mplan Apo 2x/0.55 objective, Mplan Apo 10x/0.28 objective, temp-controlled 12in vacuum chuck, Cascade ProberBench II-LC4-RM electronics module. . Mfg 2007. Includes: Cascade ProberBench Joystick Controller 2; 2ea GBB PicoProbe power supplies; 3ea FormFactor DPP210 micromanipulators; industrial control PC; LED F3000 illumination source; dual monitor workstation; ATT M300 temperature controller s/n 0808-02777; Huber Unistat 815 chiller . 65in x 45in x 67in H.配置
無配置OEM 代工型號說明
The PA300 is an analytical prober conforming to EN 61010 - 1: 1993-04 which corresponds to UL 3101-1: 1993 and IEC 1010-1: 1992. By means of the PA300 electrical measurements on wafers and substrates up to a diameter of 300mm can be made. The only electrical connection to the measuring object is through the probecard, the probehead and the chuck.文檔
無文檔
類別
Probers
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
123901
晶圓尺寸:
未知
年份:
2007
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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SUSS MicroTec / KARL SUSS
PA300
類別
Probers
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
123901
晶圓尺寸:
未知
年份:
2007
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
Suss MicroTec PA300 ProbeShield Probing Station, 115V, 60Hz, w/ Seiwa Optical Correct probing microscope, Guppy F-046C IRF camera, FWF10x eyepieces, Mplan Apo 2x/0.55 objective, Mplan Apo 10x/0.28 objective, temp-controlled 12in vacuum chuck, Cascade ProberBench II-LC4-RM electronics module. . Mfg 2007. Includes: Cascade ProberBench Joystick Controller 2; 2ea GBB PicoProbe power supplies; 3ea FormFactor DPP210 micromanipulators; industrial control PC; LED F3000 illumination source; dual monitor workstation; ATT M300 temperature controller s/n 0808-02777; Huber Unistat 815 chiller . 65in x 45in x 67in H.配置
無配置OEM 代工型號說明
The PA300 is an analytical prober conforming to EN 61010 - 1: 1993-04 which corresponds to UL 3101-1: 1993 and IEC 1010-1: 1992. By means of the PA300 electrical measurements on wafers and substrates up to a diameter of 300mm can be made. The only electrical connection to the measuring object is through the probecard, the probehead and the chuck.文檔
無文檔