描述
FEATURES AND BENEFITS - Application flexibility for failure analysis, design and verification, parametric and functional tests - Precision and stability for submicron probing - Accommodates packaged parts and single chips as well as wafers and substrates - Configurations for measuring from attoAmpere level DC to 220 GHz high frequency - Low noise and frost-free measurements from –65°C to 400°C with the SUSS ProbeShield® - Interfaces to leading analysis instrumentation, optics, software and testers - ProberBench operating system, fully operable with or without a PC To Include: (1) Thermochuck 6in配置
- Karl Suss Joystick Controller & Power Supply, - Motorized Mitutoyo Microscope with Mitutoyo Objectives & Eye Piece - Motorized Chuck Platform - Optem Fiber & Illuminator, - Basler Scout IR Camera - Anti-vibration table - Karl Suss Manual High Frequency Probe Head & Arm (PH250HF) - 3units - Probe arm and probe head - 3units - XYZ Edmund Optic Micro Positioners- 1 unitOEM 代工型號說明
The SUSS PA200 Semiautomatic Probe System is available as two versions, one for high speed (HS) and one for high resolution (HR) applications. They are both very stable, modular and flexible probe systems for wafers and substrates up to 200 mm (8).文檔
無文檔
SUSS MicroTec / KARL SUSS
PA200
已驗證
類別
Probers
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
64434
晶圓尺寸:
8"/200mm
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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SUSS MicroTec / KARL SUSS
PA200
類別
Probers
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
64434
晶圓尺寸:
8"/200mm
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
FEATURES AND BENEFITS - Application flexibility for failure analysis, design and verification, parametric and functional tests - Precision and stability for submicron probing - Accommodates packaged parts and single chips as well as wafers and substrates - Configurations for measuring from attoAmpere level DC to 220 GHz high frequency - Low noise and frost-free measurements from –65°C to 400°C with the SUSS ProbeShield® - Interfaces to leading analysis instrumentation, optics, software and testers - ProberBench operating system, fully operable with or without a PC To Include: (1) Thermochuck 6in配置
- Karl Suss Joystick Controller & Power Supply, - Motorized Mitutoyo Microscope with Mitutoyo Objectives & Eye Piece - Motorized Chuck Platform - Optem Fiber & Illuminator, - Basler Scout IR Camera - Anti-vibration table - Karl Suss Manual High Frequency Probe Head & Arm (PH250HF) - 3units - Probe arm and probe head - 3units - XYZ Edmund Optic Micro Positioners- 1 unitOEM 代工型號說明
The SUSS PA200 Semiautomatic Probe System is available as two versions, one for high speed (HS) and one for high resolution (HR) applications. They are both very stable, modular and flexible probe systems for wafers and substrates up to 200 mm (8).文檔
無文檔