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描述
Fully Automatic Prober with an inker配置
Manufacturer: Electroglas Model: Horizon 4085X Type: Fully Automatic Prober with an inker Version: 200 mm Condition: good Vintage: Jan 1998 Sale condition: as is where is Comments: Ce marked Dimensions: 160/180 Weight: 1000 kg Chuck has temperature control. TRANS Component Tag – Standard Has docking hardware to fit to an AGILENT Tech 4062 Parametric Tester E-Test Optem HF Video Microscope The prober is fitted with an inker, which marks bad dies during the inspection.OEM 代工型號說明
The Electroglas Horizon 4085X Automatic Wafer Prober System is a precision manufacturing machine which moves wafer through the test process quickly, accurately, and safely. It is designed to probe high - pin - count devices, performing with high accuracy in an enclosed clean environment. Probing accuracy is certified to +/- 0.25 mil, required for probing small densely packed bond pads.文檔
無文檔
類別
Probers
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
29016
晶圓尺寸:
未知
年份:
1998
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
MARTEK / ELECTROGLAS (EG)
HORIZON 4085X
類別
Probers
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
29016
晶圓尺寸:
未知
年份:
1998
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
Fully Automatic Prober with an inker配置
Manufacturer: Electroglas Model: Horizon 4085X Type: Fully Automatic Prober with an inker Version: 200 mm Condition: good Vintage: Jan 1998 Sale condition: as is where is Comments: Ce marked Dimensions: 160/180 Weight: 1000 kg Chuck has temperature control. TRANS Component Tag – Standard Has docking hardware to fit to an AGILENT Tech 4062 Parametric Tester E-Test Optem HF Video Microscope The prober is fitted with an inker, which marks bad dies during the inspection.OEM 代工型號說明
The Electroglas Horizon 4085X Automatic Wafer Prober System is a precision manufacturing machine which moves wafer through the test process quickly, accurately, and safely. It is designed to probe high - pin - count devices, performing with high accuracy in an enclosed clean environment. Probing accuracy is certified to +/- 0.25 mil, required for probing small densely packed bond pads.文檔
無文檔