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FORM FACTOR / CASCADE MICROTECH / FRT SUMMIT 12000
  • FORM FACTOR / CASCADE MICROTECH / FRT SUMMIT 12000
  • FORM FACTOR / CASCADE MICROTECH / FRT SUMMIT 12000
  • FORM FACTOR / CASCADE MICROTECH / FRT SUMMIT 12000
  • FORM FACTOR / CASCADE MICROTECH / FRT SUMMIT 12000
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配置
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OEM 代工型號說明
The Cascade Microtech Summit 12000 is a semi-automatic thermal wafer prober that allows you to access the full measurement range of your test instrumentation. It reduces noise, leakage, stray capacitance and measurement settling times1. The Summit 12000 probe station is designed for high-performance RF/microwave measurements and is ideal for on-wafer device characterization
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PREFERRED
 
SELLER
類別
Probers

上次驗證: 15 天前

Buyer pays 12% premium of final sale price
關鍵商品詳情

條件:

Used


作業狀態:

未知


產品編號:

99006


晶圓尺寸:

未知


年份:

未知


Have Additional Questions?
Logistics Support
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PREFERRED
 
SELLER

FORM FACTOR / CASCADE MICROTECH / FRT

SUMMIT 12000

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已驗證
類別
Probers
上次驗證: 15 天前
listing-photo-6ab590ad0e934b64bf4fb322be9b83c1-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/2216/6ab590ad0e934b64bf4fb322be9b83c1/0178ccb937654fbd966a5d0ab630d8f8_84f625663cac46faab76716fe5837eca1201a_mw.jpeg
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listing-photo-6ab590ad0e934b64bf4fb322be9b83c1-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/2216/6ab590ad0e934b64bf4fb322be9b83c1/9ac6e66e48f446d0838513e0b456e6bc_1169bf6ff8c9459f8b1dc9fc9403aac045005c_mw.jpeg
listing-photo-6ab590ad0e934b64bf4fb322be9b83c1-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/2216/6ab590ad0e934b64bf4fb322be9b83c1/f8b9f6b7858b41e09ea5823674024df4_f1cd1bf563e14b2cad5bbfada02bdd61_mw.jpeg
Buyer pays 12% premium of final sale price
關鍵商品詳情

條件:

Used


作業狀態:

未知


產品編號:

99006


晶圓尺寸:

未知


年份:

未知


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述
配置
無配置
OEM 代工型號說明
The Cascade Microtech Summit 12000 is a semi-automatic thermal wafer prober that allows you to access the full measurement range of your test instrumentation. It reduces noise, leakage, stray capacitance and measurement settling times1. The Summit 12000 probe station is designed for high-performance RF/microwave measurements and is ideal for on-wafer device characterization
文檔

無文檔