描述
Cascade Microtech 11000-series probe systems allow you to access the full measurement range of your test instrumentation. Noise, leakage, stray capacitance and measurement settling times have been greatly reduced. Whatever the application: DC or RF device characterization,wafer-level reliability, e-test, modeling, or yield enhancement, the 11000-series probe stations assure best-in-the-world measurements.配置
EQUIPMENT CONFIGURATION & SPECIFICATIONS: - Probe Station: Cascade Summit 11000-series manual wafer prober - Wafer Chuck: 6-inch/150mm RF/Microwave wave chuck (Ni) - Wafer Chuck Travel: X-Y travel = 203mm x 203mm with 0.1 um resolution; Z travel = 5mm with 1 um resolution Microscope: Optem A-Zoom2 microscope (model # 48-10-32-03); with Optem HR10x/0.54 high-resolution objective lens and Mitutoyo WF10x/24 eyepiece lenses Large Area Bridge Mount: 6-inch X axis travel (+/- 3-inch from center of travel); 8-inch Y axis travel (+/- 4-inch from center of travel); 3-inch linear manual Z-lift OPTIONAL ACCESSORIES (sold separately, please inquire about availability) Additional microscope objective lenses. Please inquire about additional objective lens magnifications in stock Vibration-Isolation workstationOEM 代工型號說明
The Cascade Microtech Summit 11000 is a manual wafer prober that allows you to access the full measurement range of your test instrumentation. It reduces noise, leakage, stray capacitance and measurement settling times. The Summit 11000 probe station is designed for high-performance RF/microwave measurements and is ideal for on-wafer device characterization文檔
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類別
Probers
上次驗證: 29 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
125836
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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FORM FACTOR / CASCADE MICROTECH / FRT
SUMMIT 11000
類別
Probers
上次驗證: 29 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
125836
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
Cascade Microtech 11000-series probe systems allow you to access the full measurement range of your test instrumentation. Noise, leakage, stray capacitance and measurement settling times have been greatly reduced. Whatever the application: DC or RF device characterization,wafer-level reliability, e-test, modeling, or yield enhancement, the 11000-series probe stations assure best-in-the-world measurements.配置
EQUIPMENT CONFIGURATION & SPECIFICATIONS: - Probe Station: Cascade Summit 11000-series manual wafer prober - Wafer Chuck: 6-inch/150mm RF/Microwave wave chuck (Ni) - Wafer Chuck Travel: X-Y travel = 203mm x 203mm with 0.1 um resolution; Z travel = 5mm with 1 um resolution Microscope: Optem A-Zoom2 microscope (model # 48-10-32-03); with Optem HR10x/0.54 high-resolution objective lens and Mitutoyo WF10x/24 eyepiece lenses Large Area Bridge Mount: 6-inch X axis travel (+/- 3-inch from center of travel); 8-inch Y axis travel (+/- 4-inch from center of travel); 3-inch linear manual Z-lift OPTIONAL ACCESSORIES (sold separately, please inquire about availability) Additional microscope objective lenses. Please inquire about additional objective lens magnifications in stock Vibration-Isolation workstationOEM 代工型號說明
The Cascade Microtech Summit 11000 is a manual wafer prober that allows you to access the full measurement range of your test instrumentation. It reduces noise, leakage, stray capacitance and measurement settling times. The Summit 11000 probe station is designed for high-performance RF/microwave measurements and is ideal for on-wafer device characterization文檔
無文檔