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描述
無描述配置
Confirm Standard Configuration includes: Stage:12" Travel of Stage:301 mm x 301 mm Theta travel:± 7.5 degrees Microscope spec:Optem A-Zoom Options: Head Stage:NA Test Head Connection Jig:NA Ambient/Room Temp Chuck:-55°C to 200°C Heater ( Yes/No ):Yes (Thermal Controller and Chiller) GP-IB Interface:Yes RS232 Interface:NA Light Source:Yes Table:NA Manuals:NA Mechnical Tester I/F, Tester Model:NA Vacuum:NA DUT sizes:NA Tester Type (Used With):NAOEM 代工型號說明
Supports wafer sizes and shards from 0.5 in. (1 mm) to up to 12 in. (300mm) Semi-Automatic Probe Station文檔
無文檔
類別
Probers
上次驗證: 超過30天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
130034
晶圓尺寸:
8"/200mm
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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FORM FACTOR / CASCADE MICROTECH / FRT
S300
類別
Probers
上次驗證: 超過30天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
130034
晶圓尺寸:
8"/200mm
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述配置
Confirm Standard Configuration includes: Stage:12" Travel of Stage:301 mm x 301 mm Theta travel:± 7.5 degrees Microscope spec:Optem A-Zoom Options: Head Stage:NA Test Head Connection Jig:NA Ambient/Room Temp Chuck:-55°C to 200°C Heater ( Yes/No ):Yes (Thermal Controller and Chiller) GP-IB Interface:Yes RS232 Interface:NA Light Source:Yes Table:NA Manuals:NA Mechnical Tester I/F, Tester Model:NA Vacuum:NA DUT sizes:NA Tester Type (Used With):NAOEM 代工型號說明
Supports wafer sizes and shards from 0.5 in. (1 mm) to up to 12 in. (300mm) Semi-Automatic Probe Station文檔
無文檔