描述
Main electronics controller Missing Prober top section (robot + sensors + optical alignment) Missing Chuck / platen Likely missing or partially present Test head docking ring Present (lower section) Wafer cassette elevator (right) Present Power modules & pneumatics Some present Side/top covers Partially included - at least one Automatically loads wafers from FOUP/cassette Moves wafer into position under a thermal or electrical test head Provides X/Y/Z/Theta precision alignment Interfaces with ATE systems for: wafer acceptance testing burn-in reliability stress testing (HTOL / LTOL / cycling) parametric wafer probe It is a very high-precision electromechanical platform used in semiconductor fabs (Intel, TSMC, Samsung, Altera—the label confirms Altera owned this one).配置
無配置OEM 代工型號說明
未提供文檔
無文檔
類別
Parts
上次驗證: 13 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
150385
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
TEL / TOKYO ELECTRON
4072A
類別
Parts
上次驗證: 13 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
150385
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
Main electronics controller Missing Prober top section (robot + sensors + optical alignment) Missing Chuck / platen Likely missing or partially present Test head docking ring Present (lower section) Wafer cassette elevator (right) Present Power modules & pneumatics Some present Side/top covers Partially included - at least one Automatically loads wafers from FOUP/cassette Moves wafer into position under a thermal or electrical test head Provides X/Y/Z/Theta precision alignment Interfaces with ATE systems for: wafer acceptance testing burn-in reliability stress testing (HTOL / LTOL / cycling) parametric wafer probe It is a very high-precision electromechanical platform used in semiconductor fabs (Intel, TSMC, Samsung, Altera—the label confirms Altera owned this one).配置
無配置OEM 代工型號說明
未提供文檔
無文檔