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描述
REGISTRATION & OPTICAL CD配置
無配置OEM 代工型號說明
PROVE® the next generation registration and overlay metrology system was successfully introduced into the market in 2010. It enables in-die measurement capability by means of high-resolution 193 nm optics, as well as optimized illumination for best contrast and pellicle compatibility.文檔
無文檔
類別
Overlay
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
73742
晶圓尺寸:
未知
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ZEISS / CARL ZEISS
PROVE
類別
Overlay
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
73742
晶圓尺寸:
未知
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
REGISTRATION & OPTICAL CD配置
無配置OEM 代工型號說明
PROVE® the next generation registration and overlay metrology system was successfully introduced into the market in 2010. It enables in-die measurement capability by means of high-resolution 193 nm optics, as well as optimized illumination for best contrast and pellicle compatibility.文檔
無文檔