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PROVE
類別
Overlay概述
PROVE® the next generation registration and overlay metrology system was successfully introduced into the market in 2010. It enables in-die measurement capability by means of high-resolution 193 nm optics, as well as optimized illumination for best contrast and pellicle compatibility.
活躍中的上架商品
1
服務
檢驗、保險、評估、物流
