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ONTO / RUDOLPH / AUGUST SpectraLASER 200 XL
    描述
    Film Thickness Measurement System
    配置
    無配置
    OEM 代工型號說明
    The SpectraLASER 200 XL is a product by Rudolph Technologies that provides repeatable t, n, and k measurements for semiconductor process control. It uses intense laser light for small-spot measurements on product wafers in various applications, including CMP, CVD, diffusion, lithography, and etch. The stable laser light output and long laser lifetimes (20-30,000 hours) ensure system-to-system matching and measurement stability. The product also features a deep UV reflectometer and simultaneous multiple angle of incidence data acquisition for optimum sensitivity. These capabilities allow the SpectraLASER 200 XL to characterize new semiconductor manufacturing processes and maintain control over them long term.
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    ONTO / RUDOLPH / AUGUST

    SpectraLASER 200 XL

    verified-listing-icon

    已驗證

    類別
    Metrology

    上次驗證: 超過30天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    104576


    晶圓尺寸:

    8"/200mm


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    類似上架商品
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    ONTO / RUDOLPH / AUGUST SpectraLASER 200 XL

    ONTO / RUDOLPH / AUGUST

    SpectraLASER 200 XL

    Metrology
    年份: 0條件: 二手
    上次驗證超過30天前

    ONTO / RUDOLPH / AUGUST

    SpectraLASER 200 XL

    verified-listing-icon
    已驗證
    類別
    Metrology
    上次驗證: 超過30天前
    listing-photo-88c366d2fa174c5dbb22a6d7999573f8-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    104576


    晶圓尺寸:

    8"/200mm


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    Film Thickness Measurement System
    配置
    無配置
    OEM 代工型號說明
    The SpectraLASER 200 XL is a product by Rudolph Technologies that provides repeatable t, n, and k measurements for semiconductor process control. It uses intense laser light for small-spot measurements on product wafers in various applications, including CMP, CVD, diffusion, lithography, and etch. The stable laser light output and long laser lifetimes (20-30,000 hours) ensure system-to-system matching and measurement stability. The product also features a deep UV reflectometer and simultaneous multiple angle of incidence data acquisition for optimum sensitivity. These capabilities allow the SpectraLASER 200 XL to characterize new semiconductor manufacturing processes and maintain control over them long term.
    文檔

    無文檔

    類似上架商品
    查看全部
    ONTO / RUDOLPH / AUGUST SpectraLASER 200 XL

    ONTO / RUDOLPH / AUGUST

    SpectraLASER 200 XL

    Metrology年份: 0條件: 二手上次驗證:超過30天前