描述
Wire bonding machine配置
無配置OEM 代工型號說明
The Metra 7200 is Nanometrics’ advanced overlay metrology and CD measurement system. The Metra’s high throughput and on-board, real-time, stepper-specific modeling provides the fastest time-to-decision for making accurate stepper adjustments. The Metra’s stepper-specific modeling software analyzes every unique stage and lens term to provide the tightest overlay possible, directly improving device performance and yield. Complete analysis can be performed for any stepper including Nikon, Canon, SVGL and Ultratech. The Metra’s analysis uses an embedded version of the ARGUS® stepper modeling library developed by New Vision Systems. In addition, the system’s multi-tasking Windows NT®-based software allows engineering functions, such as recipe creation, to occur simultaneously while production wafers are being measured, thus providing high equipment utilization.文檔
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NANOMETRICS / METRA
7200
已驗證
類別
Metrology
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
65409
晶圓尺寸:
未知
年份:
2007
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
NANOMETRICS / METRA
7200
已驗證
類別
Metrology
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
65409
晶圓尺寸:
未知
年份:
2007
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
Wire bonding machine配置
無配置OEM 代工型號說明
The Metra 7200 is Nanometrics’ advanced overlay metrology and CD measurement system. The Metra’s high throughput and on-board, real-time, stepper-specific modeling provides the fastest time-to-decision for making accurate stepper adjustments. The Metra’s stepper-specific modeling software analyzes every unique stage and lens term to provide the tightest overlay possible, directly improving device performance and yield. Complete analysis can be performed for any stepper including Nikon, Canon, SVGL and Ultratech. The Metra’s analysis uses an embedded version of the ARGUS® stepper modeling library developed by New Vision Systems. In addition, the system’s multi-tasking Windows NT®-based software allows engineering functions, such as recipe creation, to occur simultaneously while production wafers are being measured, thus providing high equipment utilization.文檔
無文檔