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ONTO / NANOMETRICS / ACCENT / BIO-RAD TRAJECTORY T3
    描述
    Film Thickness Measurement System
    配置
    無配置
    OEM 代工型號說明
    The Trajectory T³ is a cutting-edge metrology module developed by Nanometrics for monitoring and controlling critical processes in semiconductor fabs worldwide. It has been approved for integration by leading process tool manufacturers and has set new standards for speed, reliability, and cost. With its robust large area optical collectors, simple yet powerful spectral detectors, and a MTBF of over 10,000 hours, the Trajectory T³ minimizes cost while maximizing performance. Capable of processing over 250 wafers per hour, it can measure every process wafer even on the fastest process tools. By enabling process tools to measure thicknesses inside the tool and inside the wafer’s patterned devices, the Trajectory T³ delivers unparalleled advantages in speed, reliability, and cost. It is truly changing the game in integrated metrology.
    文檔

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    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    TRAJECTORY T3

    verified-listing-icon

    已驗證

    類別
    Metrology

    上次驗證: 16 天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    83162


    晶圓尺寸:

    未知


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    類似上架商品
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    ONTO / NANOMETRICS / ACCENT / BIO-RAD TRAJECTORY T3

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    TRAJECTORY T3

    Metrology
    年份: 0條件: 二手
    上次驗證16 天前

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    TRAJECTORY T3

    verified-listing-icon
    已驗證
    類別
    Metrology
    上次驗證: 16 天前
    listing-photo-0b3875034164430c91275754a78753c6-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    83162


    晶圓尺寸:

    未知


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    Film Thickness Measurement System
    配置
    無配置
    OEM 代工型號說明
    The Trajectory T³ is a cutting-edge metrology module developed by Nanometrics for monitoring and controlling critical processes in semiconductor fabs worldwide. It has been approved for integration by leading process tool manufacturers and has set new standards for speed, reliability, and cost. With its robust large area optical collectors, simple yet powerful spectral detectors, and a MTBF of over 10,000 hours, the Trajectory T³ minimizes cost while maximizing performance. Capable of processing over 250 wafers per hour, it can measure every process wafer even on the fastest process tools. By enabling process tools to measure thicknesses inside the tool and inside the wafer’s patterned devices, the Trajectory T³ delivers unparalleled advantages in speed, reliability, and cost. It is truly changing the game in integrated metrology.
    文檔

    無文檔

    類似上架商品
    查看全部
    ONTO / NANOMETRICS / ACCENT / BIO-RAD TRAJECTORY T3

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    TRAJECTORY T3

    Metrology年份: 0條件: 二手上次驗證:16 天前