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ONTO / NANOMETRICS / ACCENT / BIO-RAD SiPHER
    描述
    Concentration
    配置
    PL Mapping
    OEM 代工型號說明
    The SiPHER is a fully automated photoluminescence metrology system for the detection and mapping of 300mm substrate defects and metallic contamination. SiPHER detects and quantifies near surface and bulk metallic contamination in both bulk silicon and silicon epitaxial layers.
    文檔

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    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    SiPHER

    verified-listing-icon

    已驗證

    類別
    Metrology

    上次驗證: 超過30天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    112393


    晶圓尺寸:

    12"/300mm


    年份:

    2000


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    類似上架商品
    查看全部
    ONTO / NANOMETRICS / ACCENT / BIO-RAD SiPHER

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    SiPHER

    Metrology
    年份: 2000條件: 二手
    上次驗證超過30天前

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    SiPHER

    verified-listing-icon
    已驗證
    類別
    Metrology
    上次驗證: 超過30天前
    listing-photo-207d9e254c5140d79506e1700b7d832f-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    112393


    晶圓尺寸:

    12"/300mm


    年份:

    2000


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    Concentration
    配置
    PL Mapping
    OEM 代工型號說明
    The SiPHER is a fully automated photoluminescence metrology system for the detection and mapping of 300mm substrate defects and metallic contamination. SiPHER detects and quantifies near surface and bulk metallic contamination in both bulk silicon and silicon epitaxial layers.
    文檔

    無文檔

    類似上架商品
    查看全部
    ONTO / NANOMETRICS / ACCENT / BIO-RAD SiPHER

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    SiPHER

    Metrology年份: 2000條件: 二手上次驗證:超過30天前
    ONTO / NANOMETRICS / ACCENT / BIO-RAD SiPHER

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    SiPHER

    Metrology年份: 2002條件: 二手上次驗證:超過60天前