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描述
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無配置OEM 代工型號說明
The IP750Ex is a cost-effective image sensor test solution developed by Teradyne. It offers high throughput with dual core DSP and high speed data transfer at 10Gbps per instrument parallel, and can test up to 32 sites in parallel with 1024 digital pin configuration. It has broad device coverage, with the ability to test devices ranging from VGA to 32M pixels, and strong SOC test capability with the new HSD200 digital instrument. The IP750Ex is built on Teradyne’s J750 test platform, and is compatible with IP750EP/EMP test programs.文檔
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TERADYNE
IP750Ex
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Final Test
上次驗證: 超過60天前
Buyer pays 12% premium of final sale price
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Used
作業狀態:
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產品編號:
112164
晶圓尺寸:
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年份:
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描述
無描述配置
無配置OEM 代工型號說明
The IP750Ex is a cost-effective image sensor test solution developed by Teradyne. It offers high throughput with dual core DSP and high speed data transfer at 10Gbps per instrument parallel, and can test up to 32 sites in parallel with 1024 digital pin configuration. It has broad device coverage, with the ability to test devices ranging from VGA to 32M pixels, and strong SOC test capability with the new HSD200 digital instrument. The IP750Ex is built on Teradyne’s J750 test platform, and is compatible with IP750EP/EMP test programs.文檔
無文檔