描述
Boards: HSD10 - x8 DPS - x4 ICMD - x4 Cub - x1 - Control Rack, Test Head, Power Conditioner - Includes Engineering Cart, or Base Cart - Manipulator, Calibration Board not included DIAG (Quick-Module-Calibration) passed配置
無配置OEM 代工型號說明
The IP750Ex is a cost-effective image sensor test solution developed by Teradyne. It offers high throughput with dual core DSP and high speed data transfer at 10Gbps per instrument parallel, and can test up to 32 sites in parallel with 1024 digital pin configuration. It has broad device coverage, with the ability to test devices ranging from VGA to 32M pixels, and strong SOC test capability with the new HSD200 digital instrument. The IP750Ex is built on Teradyne’s J750 test platform, and is compatible with IP750EP/EMP test programs.文檔
無文檔
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TERADYNE
IP750Ex
類別
Final Test
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
Deinstalled
產品編號:
97585
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
Boards: HSD10 - x8 DPS - x4 ICMD - x4 Cub - x1 - Control Rack, Test Head, Power Conditioner - Includes Engineering Cart, or Base Cart - Manipulator, Calibration Board not included DIAG (Quick-Module-Calibration) passed配置
無配置OEM 代工型號說明
The IP750Ex is a cost-effective image sensor test solution developed by Teradyne. It offers high throughput with dual core DSP and high speed data transfer at 10Gbps per instrument parallel, and can test up to 32 sites in parallel with 1024 digital pin configuration. It has broad device coverage, with the ability to test devices ranging from VGA to 32M pixels, and strong SOC test capability with the new HSD200 digital instrument. The IP750Ex is built on Teradyne’s J750 test platform, and is compatible with IP750EP/EMP test programs.文檔
無文檔