描述
Tester配置
512ch head(1), ws(PFU limited PDS-BX01E0335), ICUA(4, 517-426-01), Accessary(test jig&cable set)OEM 代工型號說明
The IP750EP is a powerful digital test system designed for the testing needs of CCD/CMOS image sensor devices. It features a 100 MHz digital test capability and supports CCD devices exceeding 10 Megapixels, as well as the digitized pixel capture function required of CMOS image sensors. With high-speed, multisite parallel testing capability up to 16 in parallel, the IP750EP helps to reduce test costs. The system also features IG-XL software, which combines the performance of the latest PC technology and Windows operating system with familiar Microsoft Windows® productivity tools (Microsoft Excel® and Visual Basic) to speed up program development. Overall, the IP750EP is a versatile and efficient solution for testing CCD/CMOS image sensor devices.文檔
無文檔
TERADYNE
IP750EP
已驗證
類別
Final Test
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
95284
晶圓尺寸:
未知
年份:
2002
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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查看全部TERADYNE
IP750EP
類別
Final Test
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
95284
晶圓尺寸:
未知
年份:
2002
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
Tester配置
512ch head(1), ws(PFU limited PDS-BX01E0335), ICUA(4, 517-426-01), Accessary(test jig&cable set)OEM 代工型號說明
The IP750EP is a powerful digital test system designed for the testing needs of CCD/CMOS image sensor devices. It features a 100 MHz digital test capability and supports CCD devices exceeding 10 Megapixels, as well as the digitized pixel capture function required of CMOS image sensors. With high-speed, multisite parallel testing capability up to 16 in parallel, the IP750EP helps to reduce test costs. The system also features IG-XL software, which combines the performance of the latest PC technology and Windows operating system with familiar Microsoft Windows® productivity tools (Microsoft Excel® and Visual Basic) to speed up program development. Overall, the IP750EP is a versatile and efficient solution for testing CCD/CMOS image sensor devices.文檔
無文檔