跳到主要內容
6" Fab For Sale from Moov - Click Here to Learn More
6" Fab For Sale from Moov - Click Here to Learn More
Moov logo

6" Fab For Sale from Moov - Click Here to Learn More
Moov Icon
TERADYNE IP750EP
    描述
    Tester
    配置
    無配置
    OEM 代工型號說明
    The IP750EP is a powerful digital test system designed for the testing needs of CCD/CMOS image sensor devices. It features a 100 MHz digital test capability and supports CCD devices exceeding 10 Megapixels, as well as the digitized pixel capture function required of CMOS image sensors. With high-speed, multisite parallel testing capability up to 16 in parallel, the IP750EP helps to reduce test costs. The system also features IG-XL software, which combines the performance of the latest PC technology and Windows operating system with familiar Microsoft Windows® productivity tools (Microsoft Excel® and Visual Basic) to speed up program development. Overall, the IP750EP is a versatile and efficient solution for testing CCD/CMOS image sensor devices.
    文檔

    無文檔

    TERADYNE

    IP750EP

    verified-listing-icon

    已驗證

    類別
    Final Test

    上次驗證: 7 天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    72196


    晶圓尺寸:

    未知


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    類似上架商品
    查看全部
    TERADYNE IP750EP

    TERADYNE

    IP750EP

    Final Test
    年份: 0條件: 二手
    上次驗證7 天前

    TERADYNE

    IP750EP

    verified-listing-icon
    已驗證
    類別
    Final Test
    上次驗證: 7 天前
    listing-photo-d812e51cc0f146a4aee51e8edc7b487f-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    72196


    晶圓尺寸:

    未知


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    Tester
    配置
    無配置
    OEM 代工型號說明
    The IP750EP is a powerful digital test system designed for the testing needs of CCD/CMOS image sensor devices. It features a 100 MHz digital test capability and supports CCD devices exceeding 10 Megapixels, as well as the digitized pixel capture function required of CMOS image sensors. With high-speed, multisite parallel testing capability up to 16 in parallel, the IP750EP helps to reduce test costs. The system also features IG-XL software, which combines the performance of the latest PC technology and Windows operating system with familiar Microsoft Windows® productivity tools (Microsoft Excel® and Visual Basic) to speed up program development. Overall, the IP750EP is a versatile and efficient solution for testing CCD/CMOS image sensor devices.
    文檔

    無文檔

    類似上架商品
    查看全部
    TERADYNE IP750EP

    TERADYNE

    IP750EP

    Final Test年份: 0條件: 二手上次驗證:7 天前
    TERADYNE IP750EP

    TERADYNE

    IP750EP

    Final Test年份: 0條件: 二手上次驗證:超過60天前