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ADVANTEST T2000 AiR
  • ADVANTEST T2000 AiR
  • ADVANTEST T2000 AiR
  • ADVANTEST T2000 AiR
描述
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配置
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OEM 代工型號說明
Advantest’s new T2000 AiR offers broad test coverage for these diverse modules and system-in- package (SiP) devices. With its modular architecture providing maximum flexibility, the tester can be configured with up to six discrete air-cooled measurement modules. This enables single-system test coverage for a wide array of highly integrated, multi-functional devices. Designed to perform digital functions and SCAN testing over as many as 512 channels in parallel, the system can test high-voltage devices up to 2,000 volts, high-precision DC converters, automotive DC devices, mixed-signal ICs with bandwidths up to 100 MHz, RF communication chips and CMOS image sensors.
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類別
Final Test

上次驗證: 超過60天前

關鍵商品詳情

條件:

Used


作業狀態:

未知


產品編號:

112652


晶圓尺寸:

未知


年份:

未知


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

ADVANTEST

T2000 AiR

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已驗證
類別
Final Test
上次驗證: 超過60天前
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關鍵商品詳情

條件:

Used


作業狀態:

未知


產品編號:

112652


晶圓尺寸:

未知


年份:

未知


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述
配置
無配置
OEM 代工型號說明
Advantest’s new T2000 AiR offers broad test coverage for these diverse modules and system-in- package (SiP) devices. With its modular architecture providing maximum flexibility, the tester can be configured with up to six discrete air-cooled measurement modules. This enables single-system test coverage for a wide array of highly integrated, multi-functional devices. Designed to perform digital functions and SCAN testing over as many as 512 channels in parallel, the system can test high-voltage devices up to 2,000 volts, high-precision DC converters, automotive DC devices, mixed-signal ICs with bandwidths up to 100 MHz, RF communication chips and CMOS image sensors.
文檔

無文檔