描述
無描述配置
無配置OEM 代工型號說明
The T6673 is designed to reduce total test costs associated with the production of SoC semiconductors. The T6673 is designed to test SiC semiconductors incorporated into high-speed communication network equipment and wireless handsets, digital consumer products and other electronic systems. The T6673 can test semiconductor chips with a maximum pin count 1,024, thus matching the trend of SoC semiconductors with increasing pin counts. The T6673 is capable of both front- and back-end testing of SoC semiconductors.文檔
無文檔
ADVANTEST
T6673
已驗證
類別
Final Test
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
92728
晶圓尺寸:
未知
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ADVANTEST
T6673
已驗證
類別
Final Test
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
92728
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述配置
無配置OEM 代工型號說明
The T6673 is designed to reduce total test costs associated with the production of SoC semiconductors. The T6673 is designed to test SiC semiconductors incorporated into high-speed communication network equipment and wireless handsets, digital consumer products and other electronic systems. The T6673 can test semiconductor chips with a maximum pin count 1,024, thus matching the trend of SoC semiconductors with increasing pin counts. The T6673 is capable of both front- and back-end testing of SoC semiconductors.文檔
無文檔