描述
無描述配置
[PROPERTY) Version = 2.00 [SYSTEM INFORMATION) ProductType- T5833 PowerFrequency = 60 PStype THtype = OSTH MBtype - NORMAL SYS-Ctype = STANDARD RCPUcount = 0 EMfunction = STANDARD FmEcc = DISABLE FmHSFbmap = DISABLEOEM 代工型號說明
The ADVANTEST T5833 is a cost-efficient, high-volume test solution capable of conducting wafer sort and final test for DRAM and NAND flash memory devices. With the increasing demand for faster and higher-capacity memory devices in mobile electronics, smart phones, tablets, internet, and cloud servers, chipmakers face challenges in testing a wide array of memory devices while maintaining high functionality and performance at a low cost of test (COT). The T5833 addresses these needs by offering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories, and next-generation non-volatile memory ICs.文檔
無文檔
ADVANTEST
T5833
已驗證
類別
Final Test
上次驗證: 22 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
102899
晶圓尺寸:
未知
年份:
2019
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ADVANTEST
T5833
類別
Final Test
上次驗證: 22 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
102899
晶圓尺寸:
未知
年份:
2019
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述配置
[PROPERTY) Version = 2.00 [SYSTEM INFORMATION) ProductType- T5833 PowerFrequency = 60 PStype THtype = OSTH MBtype - NORMAL SYS-Ctype = STANDARD RCPUcount = 0 EMfunction = STANDARD FmEcc = DISABLE FmHSFbmap = DISABLEOEM 代工型號說明
The ADVANTEST T5833 is a cost-efficient, high-volume test solution capable of conducting wafer sort and final test for DRAM and NAND flash memory devices. With the increasing demand for faster and higher-capacity memory devices in mobile electronics, smart phones, tablets, internet, and cloud servers, chipmakers face challenges in testing a wide array of memory devices while maintaining high functionality and performance at a low cost of test (COT). The T5833 addresses these needs by offering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories, and next-generation non-volatile memory ICs.文檔
無文檔