描述
fully operational配置
DIAG/G SYSTEM CONFIGURATION GENERATE CONFIGURATION OF TEST HEAD NUMBER OF TEST HEAD [1,2] ..........................> 1 CONFIGURATION OF TEST HEAD 1 (0:NOT EXIST 1:NORMAL BOARD 2:HSC BOARD) 1 1 1 1 1 1 1 2 2 2 2 3 3 4 5 9 0 0 1 6 6 7 7 2 3 3 4 3 9 5 1 7 3 9 5 1 7 3 9 5 1 7 3 A A A A A A A A A A A A A A A A CHILD A1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 CONFIGURATION OF DPU TEST HEAD 1 DC CONFIGURATION [1‐ 64] ...........> 1‐32 10V PPS CONFIGURATION [1‐320] ...........> 1‐128 AC FREQUENCY (Hz) [50,60] ...........> 60 CONFIGURATION OF ALPG SUBALPG OPTION EXIST [Y,N] .........................> NO CONFIGURATION OF PDS SUFFIX OF PDSDR [1:NONE,2:X02] .....................> 1 CONFIGURATION OF DBM DBM OPTION EXIST [Y,N] .............................> NO CONFIGURATION OF FM NUMBER OF FM BOARD [0,2,4,8] ........................> 0 CONFIGURATION OF SC DQS ANALIZER OPTION EXIST [Y,N] ....................> NOOEM 代工型號說明
The ADVANTEST T5593 is a specialized test system designed for memory semiconductors, specifically targeting high-speed SRAM, DDR-SRAM, DDR2-SDRAM, DDR3-SDRAM, SGRAM, and DRAM markets. SRAM, which stands for static random access memory, is a type of semiconductor memory that does not require refreshing while powered on, unlike DRAM. SGRAM, or synchronous graphics random access memory, is used for graphics applications. The T5593 is optimized for designing and manufacturing super high-speed memory devices. It offers the capability to simultaneously test up to 256 DDR2-SDRAM devices, providing efficient and reliable testing for these memory types.文檔
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ADVANTEST
T5593
已驗證
類別
Final Test
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
66525
晶圓尺寸:
未知
年份:
2005
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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ADVANTEST
T5593
類別
Final Test
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
66525
晶圓尺寸:
未知
年份:
2005
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
fully operational配置
DIAG/G SYSTEM CONFIGURATION GENERATE CONFIGURATION OF TEST HEAD NUMBER OF TEST HEAD [1,2] ..........................> 1 CONFIGURATION OF TEST HEAD 1 (0:NOT EXIST 1:NORMAL BOARD 2:HSC BOARD) 1 1 1 1 1 1 1 2 2 2 2 3 3 4 5 9 0 0 1 6 6 7 7 2 3 3 4 3 9 5 1 7 3 9 5 1 7 3 9 5 1 7 3 A A A A A A A A A A A A A A A A CHILD A1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 CONFIGURATION OF DPU TEST HEAD 1 DC CONFIGURATION [1‐ 64] ...........> 1‐32 10V PPS CONFIGURATION [1‐320] ...........> 1‐128 AC FREQUENCY (Hz) [50,60] ...........> 60 CONFIGURATION OF ALPG SUBALPG OPTION EXIST [Y,N] .........................> NO CONFIGURATION OF PDS SUFFIX OF PDSDR [1:NONE,2:X02] .....................> 1 CONFIGURATION OF DBM DBM OPTION EXIST [Y,N] .............................> NO CONFIGURATION OF FM NUMBER OF FM BOARD [0,2,4,8] ........................> 0 CONFIGURATION OF SC DQS ANALIZER OPTION EXIST [Y,N] ....................> NOOEM 代工型號說明
The ADVANTEST T5593 is a specialized test system designed for memory semiconductors, specifically targeting high-speed SRAM, DDR-SRAM, DDR2-SDRAM, DDR3-SDRAM, SGRAM, and DRAM markets. SRAM, which stands for static random access memory, is a type of semiconductor memory that does not require refreshing while powered on, unlike DRAM. SGRAM, or synchronous graphics random access memory, is used for graphics applications. The T5593 is optimized for designing and manufacturing super high-speed memory devices. It offers the capability to simultaneously test up to 256 DDR2-SDRAM devices, providing efficient and reliable testing for these memory types.文檔
無文檔