描述
58173F LED Testing System配置
Measuring instrumentsOEM 代工型號說明
The Chroma 58173, in automatic operation, comes with unique design and a whole new method for LED total power measurement. In bare wafer/chip LED test production, partial flux correction of total flux is the common measurement method in LED epitaxy industry. (See Figure 3 on flip page) However, conventional method causes some disadvantages, i.e., lower accuracy, low S/N ratio, and slow test time etc., and which are difficult to be applied on LED bar wafer/chip total power/flux test production.文檔
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CHROMA
58173
類別
Electronic Test
上次驗證: 13 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
149651
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
58173F LED Testing System配置
Measuring instrumentsOEM 代工型號說明
The Chroma 58173, in automatic operation, comes with unique design and a whole new method for LED total power measurement. In bare wafer/chip LED test production, partial flux correction of total flux is the common measurement method in LED epitaxy industry. (See Figure 3 on flip page) However, conventional method causes some disadvantages, i.e., lower accuracy, low S/N ratio, and slow test time etc., and which are difficult to be applied on LED bar wafer/chip total power/flux test production.文檔
無文檔