描述
無描述配置
LED TesterOEM 代工型號說明
The Chroma 58173, in automatic operation, comes with unique design and a whole new method for LED total power measurement. In bare wafer/chip LED test production, partial flux correction of total flux is the common measurement method in LED epitaxy industry. (See Figure 3 on flip page) However, conventional method causes some disadvantages, i.e., lower accuracy, low S/N ratio, and slow test time etc., and which are difficult to be applied on LED bar wafer/chip total power/flux test production.文檔
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CHROMA
58173
已驗證
類別
Electronic Test
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
103507
晶圓尺寸:
6"/150mm
年份:
2010
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
CHROMA
58173
類別
Electronic Test
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
103507
晶圓尺寸:
6"/150mm
年份:
2010
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述配置
LED TesterOEM 代工型號說明
The Chroma 58173, in automatic operation, comes with unique design and a whole new method for LED total power measurement. In bare wafer/chip LED test production, partial flux correction of total flux is the common measurement method in LED epitaxy industry. (See Figure 3 on flip page) However, conventional method causes some disadvantages, i.e., lower accuracy, low S/N ratio, and slow test time etc., and which are difficult to be applied on LED bar wafer/chip total power/flux test production.文檔
無文檔