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SEMILAB WT-2000PV
    描述
    WT-2000PVN( μ-PCD) Carrier life time measurement
    配置
    無配置
    OEM 代工型號說明
    The Semilab WT-2000PVN is a compact measurement system that can perform a range of measurements on photovoltaic (PV) cells, wafers, and blocks. The system comes with overhead functions and can be customized to meet your specific measurement needs by choosing from the available options. The WT-2000PVN is capable of measuring both blocks and ingots, as well as wafers and cells. When measuring wafers and cells, maps are typically produced, while line scans are often used for blocks or ingots to save time. However, the WT-2000PVN can do both. Many PV cell manufacturers use the WT-2000PVN for engineering development, characterization, production batch testing, and troubleshooting production issues. The system can be integrated with various measurement techniques, including µ-PCD/carrier lifetime, SHR/sheet resistance, LBIC/photovoltaic response, quantum efficiency, diffusion length, and eddy current/non-contact resistivity mapping.
    文檔

    無文檔

    類別
    Defect Inspection

    上次驗證: 超過60天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    115103


    晶圓尺寸:

    8"/200mm


    年份:

    2009


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available

    SEMILAB

    WT-2000PV

    verified-listing-icon
    已驗證
    類別
    Defect Inspection
    上次驗證: 超過60天前
    listing-photo-7b0ff1c429254d0290c433b202c23753-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/7b0ff1c429254d0290c433b202c23753/4236b8372a1f464a8af35ba0b55bd4f2_1_mw.jpg
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    115103


    晶圓尺寸:

    8"/200mm


    年份:

    2009


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    WT-2000PVN( μ-PCD) Carrier life time measurement
    配置
    無配置
    OEM 代工型號說明
    The Semilab WT-2000PVN is a compact measurement system that can perform a range of measurements on photovoltaic (PV) cells, wafers, and blocks. The system comes with overhead functions and can be customized to meet your specific measurement needs by choosing from the available options. The WT-2000PVN is capable of measuring both blocks and ingots, as well as wafers and cells. When measuring wafers and cells, maps are typically produced, while line scans are often used for blocks or ingots to save time. However, the WT-2000PVN can do both. Many PV cell manufacturers use the WT-2000PVN for engineering development, characterization, production batch testing, and troubleshooting production issues. The system can be integrated with various measurement techniques, including µ-PCD/carrier lifetime, SHR/sheet resistance, LBIC/photovoltaic response, quantum efficiency, diffusion length, and eddy current/non-contact resistivity mapping.
    文檔

    無文檔