描述
Particle Counter配置
- Wafer holder / configure : 4,6,8 inch - Chuck size : 3.7inch - S/W version : PC - Windows XP Candela Wafer Version - 6.8 Build 6 Wafer Handler Version - 230 - Laser Spec : Optical Head Assembly - Wavelength 405nm / Maximum power output 25mW Wafer Surface Detector - - Wavelength 655nm / Maximum power output 10mW Cassette Mapping Sensor - - Wavelength 670nm / Maximum power output 5mWOEM 代工型號說明
The Candela CS20 system measures surface reflectivity and topography for automatic defect detection and classification. It uses scatterometry, ellipsometry, reflectometry, and topographical analysis to inspect wafer surfaces for defects and film thickness uniformity. It is designed for inspection of transparent materials such as sapphire and GaN and can detect a wide variety of defects. It is suitable for use in the production of High Brightness Light Emitting Diodes (HBLEDs), High-Power RF Devices, and Coated Glass (CMOS imagers, LCoS chips, etc.).文檔
類別
Defect Inspection
上次驗證: 超過30天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
131288
晶圓尺寸:
4"/100mm, 6"/150mm, 8"/200mm
年份:
2011
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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CANDELA CS20
類別
Defect Inspection
上次驗證: 超過30天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
131288
晶圓尺寸:
4"/100mm, 6"/150mm, 8"/200mm
年份:
2011
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available