描述
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SEM Column NGSEM – Schottky Field Emitter Gun <5nm resolution @ 5kV ION Column Sidewinder 20nA Max current <7nm resolution @30kv GIS Confirming the change from PT to W chemistry EDS Oxford Instruments 30mm^2 detector window Inca Software Wafer Handling Currently configured as a closed cassette (FOUP).OEM 代工型號說明
The FEI Expida 1285 offers the ultimate in defect characterization, failure analysis and TEM sample preparation on patterned and unpatterned wafers. With fast and accurate 3D defect characterization, you get increased control and improved yield. The Expida 1285 includes an integrated front-end module designed to simultaneously handle 200mm and 300mm wafers using load port modules in addition to all of the performance specification of the Expida 1255S.文檔
類別
Defect Inspection
上次驗證: 7 天前
關鍵商品詳情
條件:
Used
作業狀態:
Installed / Running
產品編號:
149638
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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EXPIDA 1285
類別
Defect Inspection
上次驗證: 7 天前
關鍵商品詳情
條件:
Used
作業狀態:
Installed / Running
產品編號:
149638
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available