跳到主要內容
Moov logo
Moov Icon
ONTO / NANOMETRICS / ACCENT / BIO-RAD SPARK
    描述
    無描述
    配置
    Macro Inspecting
    OEM 代工型號說明
    Defect Inspection and Advanced Packaging Applications. SPARK defect inspection system, offers ultra-fast inspection of patterned and unpatterned semiconductor wafers. SPARK inspection systems in configurations to provide high throughput, reduced footprint systems for leading 300mm wafer metrology applications including OCD, overlay, and thin film process control.
    文檔

    無文檔

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    SPARK

    verified-listing-icon

    已驗證

    類別
    Defect Inspection

    上次驗證: 超過60天前

    關鍵商品詳情
    條件:

    Used

    作業狀態:

    未知

    產品編號:

    129951

    晶圓尺寸:

    未知

    年份:

    未知

    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    類似上架商品
    查看全部
    ONTO / NANOMETRICS / ACCENT / BIO-RAD SPARK

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    SPARK

    Defect Inspection
    年份: 0條件: 二手
    上次驗證超過60天前

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    SPARK

    verified-listing-icon
    已驗證
    類別
    Defect Inspection
    上次驗證: 超過60天前
    listing-photo-0a352d50b48a435383d5ade825738a5e-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    關鍵商品詳情
    條件:

    Used

    作業狀態:

    未知

    產品編號:

    129951

    晶圓尺寸:

    未知

    年份:

    未知

    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    無描述
    配置
    Macro Inspecting
    OEM 代工型號說明
    Defect Inspection and Advanced Packaging Applications. SPARK defect inspection system, offers ultra-fast inspection of patterned and unpatterned semiconductor wafers. SPARK inspection systems in configurations to provide high throughput, reduced footprint systems for leading 300mm wafer metrology applications including OCD, overlay, and thin film process control.
    文檔

    無文檔

    類似上架商品
    查看全部
    ONTO / NANOMETRICS / ACCENT / BIO-RAD SPARK

    ONTO / NANOMETRICS / ACCENT / BIO-RAD

    SPARK

    Defect Inspection年份: 0條件: 二手上次驗證:超過60天前