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描述
無描述配置
Macro InspectingOEM 代工型號說明
Defect Inspection and Advanced Packaging Applications. SPARK defect inspection system, offers ultra-fast inspection of patterned and unpatterned semiconductor wafers. SPARK inspection systems in configurations to provide high throughput, reduced footprint systems for leading 300mm wafer metrology applications including OCD, overlay, and thin film process control.文檔
無文檔
類別
Defect Inspection
上次驗證: 超過30天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
129951
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ONTO / NANOMETRICS / ACCENT / BIO-RAD
SPARK
類別
Defect Inspection
上次驗證: 超過30天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
129951
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述配置
Macro InspectingOEM 代工型號說明
Defect Inspection and Advanced Packaging Applications. SPARK defect inspection system, offers ultra-fast inspection of patterned and unpatterned semiconductor wafers. SPARK inspection systems in configurations to provide high throughput, reduced footprint systems for leading 300mm wafer metrology applications including OCD, overlay, and thin film process control.文檔
無文檔