The PLM-150 is a third-generation solution for manufacturers requiring high-throughput yield-management.

ONTO / NANOMETRICS / ACCENT / BIO-RAD

PLM 150

 Measurement provided: Epilayer uniformity, defects and contamination, with high-resolution capability

PLM 100

NanoUDI 9300 standalone wafer particle and defect inspection system. The NanoUDI 9300 stand-alone, high throughput, full-wafer defect inspection system detects and measures particles and defects as small as 0.1 microns on 300 millimeter diameter semiconductor wafers. The system was first introduced at SEMICON West in July 2002 and is built on the common 9300 wafer automation platform that includes the new industry standards for 300 millimeter wafer handling. 

NanoUDI 9300

Defect Inspection and Advanced Packaging Applications. SPARK defect inspection system, offers ultra-fast inspection of patterned and unpatterned semiconductor wafers.
SPARK inspection systems in configurations to provide high throughput, reduced footprint systems for leading 300mm wafer metrology applications including OCD, overlay, and thin film process control.


ONTO / NANOMETRICS / ACCENT / BIO-RAD

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最熱門的 ONTO / NANOMETRICS / ACCENT / BIO-RAD Defect Inspection

PLM 150

PLM 100

NanoUDI 9300

SPARK

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所有 ONTO / NANOMETRICS / ACCENT / BIO-RAD Defect Inspection