描述
Applied Materials SEMVision STAR Defect Analysis, Scanning Electron Microscope配置
Inspection LD: 2ea, AsystInspection SEMOEM 代工型號說明
The AMAT SEMVision G2 is a high-throughput, fully automatic Defect Analysis system developed by Applied Materials (AMAT). It is designed to be seamlessly integrated into production lines, allowing customers to analyze defects with exceptional productivity. The system is capable of detecting and analyzing defects as small as 50nm, providing crucial insights into the quality and performance of semiconductor devices during manufacturing.文檔
無文檔
APPLIED MATERIALS (AMAT)
SEMVISION G2
已驗證
類別
Defect Inspection
關鍵商品詳情
條件:
Used
作業狀態:
Installed / Running
產品編號:
93121
晶圓尺寸:
未知
年份:
2002
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
類似上架商品
查看全部無類似上架商品
APPLIED MATERIALS (AMAT)
SEMVISION G2
已驗證
類別
Defect Inspection
上次驗證: 11 天前
關鍵商品詳情
條件:
Used
作業狀態:
Installed / Running
產品編號:
93121
晶圓尺寸:
未知
年份:
2002
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
Applied Materials SEMVision STAR Defect Analysis, Scanning Electron Microscope配置
Inspection LD: 2ea, AsystInspection SEMOEM 代工型號說明
The AMAT SEMVision G2 is a high-throughput, fully automatic Defect Analysis system developed by Applied Materials (AMAT). It is designed to be seamlessly integrated into production lines, allowing customers to analyze defects with exceptional productivity. The system is capable of detecting and analyzing defects as small as 50nm, providing crucial insights into the quality and performance of semiconductor devices during manufacturing.文檔
無文檔
類似上架商品
查看全部無類似上架商品