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APPLIED MATERIALS (AMAT) COMPASS 200
    描述
    無描述
    配置
    無配置
    OEM 代工型號說明
    Applied Compass, a patterned wafer inspection systems designed for process monitoring down to the 100nm technology node. Critical defects are detected at production worthy throughput with OMNIView™, a multi-perspective laser scanning technology ensuring robust detection of a wide variety of defect types across all process layers. Compass is a high performance production tool and has the technology required for fast introduction of new technologies to volume production.
    文檔

    無文檔

    類別
    Defect Inspection

    上次驗證: 超過60天前

    關鍵商品詳情

    條件:

    Parts Tool


    作業狀態:

    未知


    產品編號:

    100302


    晶圓尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available

    APPLIED MATERIALS (AMAT)

    COMPASS 200

    verified-listing-icon
    已驗證
    類別
    Defect Inspection
    上次驗證: 超過60天前
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    關鍵商品詳情

    條件:

    Parts Tool


    作業狀態:

    未知


    產品編號:

    100302


    晶圓尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    無描述
    配置
    無配置
    OEM 代工型號說明
    Applied Compass, a patterned wafer inspection systems designed for process monitoring down to the 100nm technology node. Critical defects are detected at production worthy throughput with OMNIView™, a multi-perspective laser scanning technology ensuring robust detection of a wide variety of defect types across all process layers. Compass is a high performance production tool and has the technology required for fast introduction of new technologies to volume production.
    文檔

    無文檔