描述
無描述配置
Standard configure with 6” and 12” loadOEM 代工型號說明
The S-9380 is Hitachi’s most advanced CD-measurement SEM developed for 65 nm process control of semiconductor devices on wafers up to 300 mm in diameter. With improvement in both hardware and software, the S-9380 supports a high throughput of 33 wafers per hour with 20 measurement points per wafer, and resolution of 2.0 nm.文檔
無文檔
HITACHI
S-9380
已驗證
類別
CD-SEM
上次驗證: 27 天前
關鍵商品詳情
條件:
Used
作業狀態:
Deinstalled
產品編號:
117448
晶圓尺寸:
6"/150mm, 12"/300mm
年份:
2004
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
HITACHI
S-9380
類別
CD-SEM
上次驗證: 27 天前
關鍵商品詳情
條件:
Used
作業狀態:
Deinstalled
產品編號:
117448
晶圓尺寸:
6"/150mm, 12"/300mm
年份:
2004
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述配置
Standard configure with 6” and 12” loadOEM 代工型號說明
The S-9380 is Hitachi’s most advanced CD-measurement SEM developed for 65 nm process control of semiconductor devices on wafers up to 300 mm in diameter. With improvement in both hardware and software, the S-9380 supports a high throughput of 33 wafers per hour with 20 measurement points per wafer, and resolution of 2.0 nm.文檔
無文檔