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描述
6 to 12 inch depending on model Resolution: 3nm R&D to mass production配置
無配置OEM 代工型號說明
The S-9380 is Hitachi’s most advanced CD-measurement SEM developed for 65 nm process control of semiconductor devices on wafers up to 300 mm in diameter. With improvement in both hardware and software, the S-9380 supports a high throughput of 33 wafers per hour with 20 measurement points per wafer, and resolution of 2.0 nm.文檔
無文檔
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HITACHI
S-9380
類別
CD-SEM
上次驗證: 22 天前
關鍵商品詳情
條件:
Refurbished
作業狀態:
未知
產品編號:
131704
晶圓尺寸:
6"/150mm, 8"/200mm, 12"/300mm
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
6 to 12 inch depending on model Resolution: 3nm R&D to mass production配置
無配置OEM 代工型號說明
The S-9380 is Hitachi’s most advanced CD-measurement SEM developed for 65 nm process control of semiconductor devices on wafers up to 300 mm in diameter. With improvement in both hardware and software, the S-9380 supports a high throughput of 33 wafers per hour with 20 measurement points per wafer, and resolution of 2.0 nm.文檔
無文檔