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HITACHI S-9380 II
    描述
    無描述
    配置
    無配置
    OEM 代工型號說明
    Hitachi High-Technologies Corporation has launched DESIGNGAUGE, a mask design data measuring system aimed at improving efficiency and production yield in semiconductor device design and development. DESIGNGAUGE accurately collates and compares mask pattern design data with circuit pattern image data on the wafer, obtained through a critical dimension scanning electron microscope (CD-SEM). It enables the creation of measurement recipes offline that were previously only possible with a CD-SEM, allowing remote control of the CD-SEM to automatically align mask pattern design data with the wafer's test pattern. This significantly streamlines the data acquisition process for creating an optical proximity correction (OPC) model, reducing the time required compared to conventional techniques. Hitachi High-Tech is committed to further enhancing the accuracy and capabilities of DESIGNGAUGE and developing DFM-based measuring technologies to meet evolving metrology needs.
    文檔
    類別
    CD-SEM

    上次驗證: 超過60天前

    關鍵商品詳情

    條件:

    Refurbished


    作業狀態:

    未知


    產品編號:

    116145


    晶圓尺寸:

    8"/200mm


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available

    HITACHI

    S-9380 II

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    已驗證
    類別
    CD-SEM
    上次驗證: 超過60天前
    listing-photo-f8b2887ae3a745b3b3e313b33e3ac9f2-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/78834/f8b2887ae3a745b3b3e313b33e3ac9f2/a286bc4b510c4b97b37b9fe40221b6fa_wechatimg256_mw.jpg
    listing-photo-f8b2887ae3a745b3b3e313b33e3ac9f2-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/78834/f8b2887ae3a745b3b3e313b33e3ac9f2/03e11054ebd8408a82b03493180c382d_wechatimg257_mw.jpg
    listing-photo-f8b2887ae3a745b3b3e313b33e3ac9f2-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/78834/f8b2887ae3a745b3b3e313b33e3ac9f2/a07d1993b4614e7ab9f9c76c8be41eca_wechatimg259_mw.jpg
    listing-photo-f8b2887ae3a745b3b3e313b33e3ac9f2-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/78834/f8b2887ae3a745b3b3e313b33e3ac9f2/540255b0bd1447cba5bb0f7804d3b031_wechatimg260_mw.jpg
    關鍵商品詳情

    條件:

    Refurbished


    作業狀態:

    未知


    產品編號:

    116145


    晶圓尺寸:

    8"/200mm


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    無描述
    配置
    無配置
    OEM 代工型號說明
    Hitachi High-Technologies Corporation has launched DESIGNGAUGE, a mask design data measuring system aimed at improving efficiency and production yield in semiconductor device design and development. DESIGNGAUGE accurately collates and compares mask pattern design data with circuit pattern image data on the wafer, obtained through a critical dimension scanning electron microscope (CD-SEM). It enables the creation of measurement recipes offline that were previously only possible with a CD-SEM, allowing remote control of the CD-SEM to automatically align mask pattern design data with the wafer's test pattern. This significantly streamlines the data acquisition process for creating an optical proximity correction (OPC) model, reducing the time required compared to conventional techniques. Hitachi High-Tech is committed to further enhancing the accuracy and capabilities of DESIGNGAUGE and developing DFM-based measuring technologies to meet evolving metrology needs.
    文檔