描述
無描述配置
Resolution 5nm, Repeatability 1%, CD range ≥0.1μm Original spec - 6 inch Si OF Modified spec - 4/6inch Si/ SiC (on tray)OEM 代工型號說明
S-8640 high-resolution critical-dimension measurement scanning electron microscopes (CD-SEMs) capable of handling 300-mm wafers.文檔
無文檔
HITACHI
S-8640
類別
CD-SEM
上次驗證: 超過60天前
關鍵商品詳情
條件:
Refurbished
作業狀態:
未知
產品編號:
131709
晶圓尺寸:
4"/100mm, 6"/150mm
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述配置
Resolution 5nm, Repeatability 1%, CD range ≥0.1μm Original spec - 6 inch Si OF Modified spec - 4/6inch Si/ SiC (on tray)OEM 代工型號說明
S-8640 high-resolution critical-dimension measurement scanning electron microscopes (CD-SEMs) capable of handling 300-mm wafers.文檔
無文檔