描述
300mm depending on model Resolution: 1.8nm R&D to mass production High throughput (Faster: 36~50 wafers/h) Refurbished equipment Overhaul customer's inventory On site trouble shooting Periodic maintenance, tip replacement Fab to fab or inside fab relocations Wafer modification配置
無配置OEM 代工型號說明
The CG4000 is a cutting-edge solution for process applications, offering advanced functions that enhance both precision and efficiency. Its high-accuracy averaged CD (ACD) metrology function improves repeatability and throughput, while its industry-standard line edge roughness (LER) measurement function contributes significantly to process monitoring. These features make the CG4000 an essential tool for maintaining high standards in process applications.文檔
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HITACHI
CG4000
類別
CD-SEM
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
131696
晶圓尺寸:
12"/300mm
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
300mm depending on model Resolution: 1.8nm R&D to mass production High throughput (Faster: 36~50 wafers/h) Refurbished equipment Overhaul customer's inventory On site trouble shooting Periodic maintenance, tip replacement Fab to fab or inside fab relocations Wafer modification配置
無配置OEM 代工型號說明
The CG4000 is a cutting-edge solution for process applications, offering advanced functions that enhance both precision and efficiency. Its high-accuracy averaged CD (ACD) metrology function improves repeatability and throughput, while its industry-standard line edge roughness (LER) measurement function contributes significantly to process monitoring. These features make the CG4000 an essential tool for maintaining high standards in process applications.文檔
無文檔