BRUKER

The D2 CRYSOTM is the worldwide first and only benchtop device for a fast X-ray spectroscopic determination of the crystallographic orientation of single crystals applying a patented energy-dispersive method. In addition to the main orientation (surface orientation) the orientation of a second crystallographic direction (flat position, azimuthally orientation) can be determined without changing the position of the analyzed crystal. The measurement and analysis are performed fully automatically after the 
establishment of measurement directives. Thus, the D2 CRYSO is especially suitable for routine measurements connected to the crystal confectioning or the quality control. A process-oriented application of the benchtop system is possible. Crystals can be measured in form of wafers, plates or discs with at least one defined flat surface. The device concept and beam guide allows a simple handling of samples.

D2 CRYSO

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BRUKER

D2 CRYSO

X-Ray / XRD / XRF

類似上架商品

D2 CRYSO

X-Ray / XRD / XRF

類似上架商品