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KLA / MICROSENSE 6033T
    描述
    ADE 6033T Wafer Thickness Measurement
    配置
    Working
    OEM 代工型號說明
    The Model 6033T, using ADE’s patented capacitive measurement principle, measures wafers for Thickness and Total Thickness Variation (TVV). Whenever semiconductor wafer inspection is required, the MicroSense Model 6033T offers a low cost method of achieving fast, accurate measurements on wafers up to 150mm in diameter.
    文檔

    無文檔

    類別
    Wafer Testing

    上次驗證: 超過60天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    66065


    晶圓尺寸:

    6"/150mm


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available

    KLA / MICROSENSE

    6033T

    verified-listing-icon
    已驗證
    類別
    Wafer Testing
    上次驗證: 超過60天前
    listing-photo-35fedbd2be9d4f719a992fc5ea176e7b-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    66065


    晶圓尺寸:

    6"/150mm


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    ADE 6033T Wafer Thickness Measurement
    配置
    Working
    OEM 代工型號說明
    The Model 6033T, using ADE’s patented capacitive measurement principle, measures wafers for Thickness and Total Thickness Variation (TVV). Whenever semiconductor wafer inspection is required, the MicroSense Model 6033T offers a low cost method of achieving fast, accurate measurements on wafers up to 150mm in diameter.
    文檔

    無文檔