描述
無描述配置
Olympus AL110-LMB6 plus Olympus MX50OEM 代工型號說明
The Olympus AL110-LMB86 is an automated wafer loader designed for use with the MX61 microscope. It belongs to the AL110 series of programmable wafer handlers, which are known for their cost-effectiveness and versatility. These features make them an ideal choice when a programmable wafer handler is needed to increase throughput. The AL110 series offers a range of formats, as well as non-contact optical wafer centering and notch detection. It also boasts high-throughput and is class 10 compatible, with a stainless steel facade that makes it suitable for use in clean rooms. Additionally, it can be integrated with an MX50 or MX80 via a manual or motorized shuttle stage, allowing for automated wafer inspections.文檔
無文檔
OLYMPUS
AL110-LMB86
已驗證
類別
Wafer Handling
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
60426
晶圓尺寸:
未知
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
OLYMPUS
AL110-LMB86
類別
Wafer Handling
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
60426
晶圓尺寸:
未知
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述配置
Olympus AL110-LMB6 plus Olympus MX50OEM 代工型號說明
The Olympus AL110-LMB86 is an automated wafer loader designed for use with the MX61 microscope. It belongs to the AL110 series of programmable wafer handlers, which are known for their cost-effectiveness and versatility. These features make them an ideal choice when a programmable wafer handler is needed to increase throughput. The AL110 series offers a range of formats, as well as non-contact optical wafer centering and notch detection. It also boasts high-throughput and is class 10 compatible, with a stainless steel facade that makes it suitable for use in clean rooms. Additionally, it can be integrated with an MX50 or MX80 via a manual or motorized shuttle stage, allowing for automated wafer inspections.文檔
無文檔