描述
無描述配置
-Pod load/unload -Open the cassette , allow main console for pick and place wafer production -Installed at production machine Features: -Applicable to Reticle /150/200mm cassette -Wafer protrusion detection, prevent cassette deformation -Wafer mapping date, SECS , ACSII function -Easy maintenance -There is a fool proof device, which cannot be operated if placed incorrectly or improperlyOEM 代工型號說明
The ASYST VERSAPORT 2200 is a 200mm class load port system designed to present wafers on reticles to the process tool in a controlled environment, ensuring a cleanroom environment better than Class 1 standards for the substrate. It facilitates the smooth and contamination-free transfer of wafers, enhancing the overall efficiency and reliability of the semiconductor manufacturing process.文檔
無文檔
ASYST
VERSAPORT 2200
已驗證
類別
Wafer Handling
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
60884
晶圓尺寸:
未知
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
類似上架商品
查看全部
ASYST
VERSAPORT 2200
已驗證
類別
Wafer Handling
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
60884
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述配置
-Pod load/unload -Open the cassette , allow main console for pick and place wafer production -Installed at production machine Features: -Applicable to Reticle /150/200mm cassette -Wafer protrusion detection, prevent cassette deformation -Wafer mapping date, SECS , ACSII function -Easy maintenance -There is a fool proof device, which cannot be operated if placed incorrectly or improperlyOEM 代工型號說明
The ASYST VERSAPORT 2200 is a 200mm class load port system designed to present wafers on reticles to the process tool in a controlled environment, ensuring a cleanroom environment better than Class 1 standards for the substrate. It facilitates the smooth and contamination-free transfer of wafers, enhancing the overall efficiency and reliability of the semiconductor manufacturing process.文檔
無文檔