描述
Surface Charge Analyzer配置
無配置OEM 代工型號說明
Semilab SDI CnCV 230 tool for non-contact C-V characterisation of wide bandgap semiconductors. In response to broadening interest from the wide bandgap community, our team at Semilab SDI, based in Tampa, FL, has introduced the CnCV 200 series of tools. Its capabilities include dopant concentration profiling of GaN and SiC, measuring the two-dimensional electron-gas sheet charge in an AlGaN/GaN HEMT, and characterisation of interfaces between dielectrics and wide bandgap semiconductors文檔
無文檔
SEMITOOL
CnCV 230
類別
Thin Film / Film Thickness
上次驗證: 22 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
142961
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
Surface Charge Analyzer配置
無配置OEM 代工型號說明
Semilab SDI CnCV 230 tool for non-contact C-V characterisation of wide bandgap semiconductors. In response to broadening interest from the wide bandgap community, our team at Semilab SDI, based in Tampa, FL, has introduced the CnCV 200 series of tools. Its capabilities include dopant concentration profiling of GaN and SiC, measuring the two-dimensional electron-gas sheet charge in an AlGaN/GaN HEMT, and characterisation of interfaces between dielectrics and wide bandgap semiconductors文檔
無文檔